Delivering high-quality products is essential. In today’s competitive market Drop Testers play a crucial role in ensuring that your products can withstand the rigors of transportation, handling, and everyday use. By simulating real-world conditions, Drop Testers help identify potential weaknesses and vulnerabilities, allowing you to make necessary improvements before products reach the market.
Drop testing is crucial for ensuring your small electronics withstand real-world conditions. It helps identify weaknesses, reduce exchanges, improve customer satisfaction, and meet industry standards.
With our Drop Testers we provide complete testing protocols such as Military spec for MIL-STD 810H certification. You can also make your own custom work flows to make your product to get new heigths.
This may seem obvious, but it’s important to remember that we don’t always handle things with care – to err is human.
People have always dropped stuff, and will always be dropping stuff. Some of you are probably reading this between the cracks on your phone screen. Some of you are reading this on a screen protected by a protective case or sleeve – because you know that you will eventually drop your phone.
You chose to rely on a protective case or sleeve to help protect your phone from damage when it falls. You did not rely on the phone manufacturer nor your own hands, but reliability was a major factor.
Long story short: by prioritizing reliability, manufacturers can stay ahead of the competition and achieve long-term success in the dynamic portable device industry.
Drop Tester DT2000n is used to test the breakage of various small products up to 5 kilograms (10 kg with EW and EWW models). Features include PC hardware and software for modern drop-testing workflows. The Drop Tester n-series enables the creation and use of predefined test protocols, which facilitates test repeatability, unifies reporting, and minimizes user errors. Remote monitoring is possible with the cloud service. This device is designed for guided and free fall drop testing. It can be used to perform standardized tests in accordance with IEC 60068-2-31, IEC 60601-1, IEC 62368-1, ISO 11608-1 and MIL-STD-810H, Method 516.8. Drop height is 500–2000 mm (optionally extendable up to 5000 mm).
Heina Ltd’s drop testers provide valuable insights into product durability, helping manufacturers to improve product design, reduce costs, and enhance customer satisfaction. Drop Testing for mobile phones, medical equipment and other small electronics benefits users and manufacturers. By using these precision tools, companies can ensure that their products are reliable, safe, and ready for the challenges of the modern marketplace.
Smartphones, tablets, and laptops are increasingly used in mobile environments, where they are at risk of being dropped. Heina Ltd’s Drop Testers can help manufacturers assess the impact resistance of these devices and improve their design.
Many medical devices must meet specific regulatory standards, including drop testing requirements. Heina Ltd’s Testers can help manufacturers comply with these standards and ensure that their products are safe for use.
Small electronic devices often contain delicate components that are susceptible to damage during transportation or accidental drops. Heina Ltd’s drop testers help manufacturers evaluate the durability of their products and ensure that they can withstand the rigors of everyday use.
The vacuum head is a critical component of your Drop Tester, responsible for securely holding the test object in place during the impact test. A properly functioning vacuum head is essential for accurate and repeatable results.
Heina Ltd is proud to incorporate high-quality Omron components into our Drop Testers. Omron’s reputation for innovation, reliability, and precision aligns perfectly with our commitment to delivering exceptional testing solutions.
Each component is carefully selected and assembled by experienced technicians, ensuring that every detail meets our exacting standards. Handcrafted components often have a longer lifespan and can withstand the demands of demanding testing environments.